TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_06_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-009-01 | FUSED_ID : 6359364768389709969
  IC_TEMP :  -50.07 | VDDM : 1126.39 | AUX_INT :   -8.40 | CsaBias :   74.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07929e-03 / 2
  ADC_P0  : -8.40425e-03 ± 2.22407e-02
  ADC_P1  : 8.33648e-03 ± 5.45779e-04
  ADC_P2  : -5.43912e-06 ± 2.66649e-06
  CSA_Chi2/NDF : 1.59139e-04 / 2
  CSA_P0  : 5.97908e-02 ± 8.41416e-03
  CSA_P1  : 1.05743e-02 ± 6.33946e-04
  CSA_P2  : -5.42515e-05 ± 9.65425e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [18, 39, 42, 77, 85, 87, 101, 102, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [42, 102, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1896', '1.800', '0.1549', '1.800', '0.0864', '7.000', '0.7075', 1, 1, 1, 1, 1724933192.120947]
VI_after__Init : ['1.202', '0.1897', '1.800', '0.1549', '1.799', '0.0807', '7.000', '0.7074', 1, 1, 1, 1, 1724933200.7813416]
VI_at__the_End : ['1.201', '0.5054', '1.800', '0.1408', '1.800', '0.1125', '7.000', '0.7082', 1, 1, 1, 1, 1724933265.7682903]