TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_11_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-012-01 | FUSED_ID : 6359364768389710017
  IC_TEMP :  -45.40 | VDDM : 1132.45 | AUX_INT :   -8.05 | CsaBias :   75.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41326e-03 / 2
  ADC_P0  : -8.05378e-03 ± 2.55618e-02
  ADC_P1  : 7.63717e-03 ± 5.89760e-04
  ADC_P2  : -3.92753e-06 ± 2.70587e-06
  CSA_Chi2/NDF : 8.45410e-05 / 2
  CSA_P0  : 5.85759e-02 ± 6.13276e-03
  CSA_P1  : 9.63445e-03 ± 4.62059e-04
  CSA_P2  : -4.17526e-05 ± 7.03662e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [27, 34, 41, 45, 55, 56, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  92
 | P_BROKEN_FAST :  [0, 1, 2, 3, 4, 5, 7, 8, 9, 10, 11, 12, 14, 15, 17, 22, 23, 25, 27, 31, 33, 34, 35, 36, 42, 43, 45, 46, 50, 52, 53, 55, 58, 62, 63, 66, 68, 73, 74, 75, 77, 82, 83, 84, 85, 90, 94, 95, 96, 102, 104, 105, 109, 112, 115, 117, 121, 123, 124]
 | P_BROKEN_SLOW :  [0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 20, 21, 22, 24, 25, 26, 27, 28, 29, 30, 35, 41, 46, 54]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3246', '1.800', '0.1117', '1.800', '0.0849', '7.000', '0.7076', 1, 1, 1, 1, 1724933480.0870328]
VI_after__Init : ['1.201', '0.3249', '1.800', '0.1117', '1.800', '0.0800', '7.000', '0.7079', 1, 1, 1, 1, 1724933488.185312]
VI_at__the_End : ['1.201', '0.4966', '1.800', '0.1346', '1.800', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1724933548.161796]