TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_14_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-014-01 | FUSED_ID : 6359364768389710049
  IC_TEMP :  -48.87 | VDDM : 1132.31 | AUX_INT :   -8.25 | CsaBias :   73.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09524e-03 / 2
  ADC_P0  : -8.25151e-03 ± 2.23831e-02
  ADC_P1  : 8.22551e-03 ± 5.34779e-04
  ADC_P2  : -5.86033e-06 ± 2.53302e-06
  CSA_Chi2/NDF : 7.46031e-05 / 2
  CSA_P0  : 6.13365e-02 ± 5.76104e-03
  CSA_P1  : 9.73516e-03 ± 4.34053e-04
  CSA_P2  : -4.21254e-05 ± 6.61011e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [12, 14, 29, 40, 93, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 13, 37, 40, 44, 46]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1702', '1.800', '0.1472', '1.799', '0.0833', '7.000', '0.7077', 1, 1, 1, 1, 1724933672.6403217]
VI_after__Init : ['1.201', '0.1702', '1.800', '0.1471', '1.800', '0.0775', '7.000', '0.7078', 1, 1, 1, 1, 1724933681.3595502]
VI_at__the_End : ['1.201', '0.5034', '1.800', '0.1398', '1.801', '0.1095', '7.000', '0.7084', 1, 1, 1, 1, 1724933746.9185095]