TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_16_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-015-01 | FUSED_ID : 6359364768389710065
  IC_TEMP :  -54.45 | VDDM : 1123.30 | AUX_INT :   -9.36 | CsaBias :   66.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53531e-03 / 2
  ADC_P0  : -9.35956e-03 ± 2.65780e-02
  ADC_P1  : 8.46735e-03 ± 6.58145e-04
  ADC_P2  : -5.80938e-06 ± 3.24269e-06
  CSA_Chi2/NDF : 1.32460e-04 / 2
  CSA_P0  : 6.19930e-02 ± 7.67652e-03
  CSA_P1  : 1.03441e-02 ± 5.78370e-04
  CSA_P2  : -5.30359e-05 ± 8.80790e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [24, 61, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [26, 103, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3951', '1.800', '0.1617', '1.800', '0.0894', '7.000', '0.7079', 1, 1, 1, 1, 1724933768.4499717]
VI_after__Init : ['1.201', '0.3952', '1.800', '0.1617', '1.801', '0.0837', '7.000', '0.7080', 1, 1, 1, 1, 1724933777.2312906]
VI_at__the_End : ['1.201', '0.4990', '1.800', '0.1394', '1.799', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1724933836.9236817]