TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_19_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-017-06 | FUSED_ID : 6359364768389710102
  IC_TEMP :  -47.15 | VDDM : 1132.32 | AUX_INT :   -9.01 | CsaBias :   73.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45128e-03 / 2
  ADC_P0  : -9.00552e-03 ± 2.58502e-02
  ADC_P1  : 8.27605e-03 ± 6.30452e-04
  ADC_P2  : -5.33594e-06 ± 3.05825e-06
  CSA_Chi2/NDF : 6.22031e-05 / 2
  CSA_P0  : 6.07255e-02 ± 5.26051e-03
  CSA_P1  : 9.34255e-03 ± 3.96342e-04
  CSA_P2  : -3.78780e-05 ± 6.03582e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [17, 75, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [12, 13, 56, 64, 89, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0553', '1.800', '0.1426', '1.800', '0.0807', '7.000', '0.7077', 1, 1, 1, 1, 1724933960.6513133]
VI_after__Init : ['1.202', '0.0553', '1.800', '0.1426', '1.800', '0.0754', '7.000', '0.7077', 1, 1, 1, 1, 1724933969.3726003]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1377', '1.799', '0.1104', '7.000', '0.7082', 1, 1, 1, 1, 1724934035.2295582]