TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_24_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-020-06 | FUSED_ID : 6359364768389710150
  IC_TEMP :  -63.59 | VDDM : 1123.86 | AUX_INT :   -8.67 | CsaBias :   59.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18354e-03 / 2
  ADC_P0  : -8.67241e-03 ± 2.32651e-02
  ADC_P1  : 8.57548e-03 ± 5.75925e-04
  ADC_P2  : -6.54098e-06 ± 2.82601e-06
  CSA_Chi2/NDF : 1.62380e-04 / 2
  CSA_P0  : 6.21505e-02 ± 8.49940e-03
  CSA_P1  : 1.07043e-02 ± 6.40368e-04
  CSA_P2  : -6.12251e-05 ± 9.75205e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 16, 31, 49, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 10, 82, 94, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3028', '1.800', '0.1492', '1.800', '0.0931', '7.000', '0.7071', 1, 1, 1, 1, 1724934249.254246]
VI_after__Init : ['1.201', '0.3023', '1.800', '0.1491', '1.799', '0.0882', '7.000', '0.7071', 1, 1, 1, 1, 1724934257.249651]
VI_at__the_End : ['1.202', '0.4902', '1.800', '0.1400', '1.800', '0.1162', '7.000', '0.7081', 1, 1, 1, 1, 1724934316.7000923]