TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_25_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-021-06 | FUSED_ID : 6359364768389710166
  IC_TEMP :  -55.14 | VDDM : 1102.63 | AUX_INT :   -7.27 | CsaBias :   68.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08642e-03 / 2
  ADC_P0  : -7.27100e-03 ± 2.23176e-02
  ADC_P1  : 8.48826e-03 ± 5.56728e-04
  ADC_P2  : -6.06999e-06 ± 2.74217e-06
  CSA_Chi2/NDF : 1.50991e-04 / 2
  CSA_P0  : 5.86804e-02 ± 8.19592e-03
  CSA_P1  : 1.01687e-02 ± 6.17503e-04
  CSA_P2  : -5.09901e-05 ± 9.40385e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 38, 39, 48, 60, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 40, 44, 68, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1689', '1.800', '0.1594', '1.800', '0.0871', '7.000', '0.7081', 1, 1, 1, 1, 1724934345.8598704]
VI_after__Init : ['1.202', '0.1688', '1.800', '0.1593', '1.800', '0.0807', '7.000', '0.7076', 1, 1, 1, 1, 1724934353.8942723]
VI_at__the_End : ['1.202', '0.4927', '1.800', '0.1368', '1.799', '0.1146', '7.000', '0.7078', 1, 1, 1, 1, 1724934421.9450092]