TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_27_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-022-06 | FUSED_ID : 6359364768389710182
  IC_TEMP :  -57.33 | VDDM : 1137.09 | AUX_INT :   -4.51 | CsaBias :   78.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.30820e-04 / 2
  ADC_P0  : -4.51105e-03 ± 1.69795e-02
  ADC_P1  : 8.32219e-03 ± 4.20665e-04
  ADC_P2  : -5.62581e-06 ± 2.05274e-06
  CSA_Chi2/NDF : 1.75385e-04 / 2
  CSA_P0  : 6.08487e-02 ± 8.83321e-03
  CSA_P1  : 1.08245e-02 ± 6.65519e-04
  CSA_P2  : -5.71475e-05 ± 1.01351e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [24, 28, 51, 60, 88, 92, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [26, 68, 74, 94, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2877', '1.800', '0.1762', '1.800', '0.0898', '7.000', '0.7078', 1, 1, 1, 1, 1724934442.0255022]
VI_after__Init : ['1.201', '0.2878', '1.800', '0.1762', '1.800', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1724934450.2268934]
VI_at__the_End : ['1.201', '0.5112', '1.800', '0.1408', '1.800', '0.1118', '7.000', '0.7077', 1, 1, 1, 1, 1724934510.04719]