TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_28_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-023-06 | FUSED_ID : 6359364768389710198
  IC_TEMP :  -52.31 | VDDM : 1111.33 | AUX_INT :   -6.58 | CsaBias :   74.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05837e-03 / 2
  ADC_P0  : -6.58016e-03 ± 2.20819e-02
  ADC_P1  : 8.12421e-03 ± 5.41420e-04
  ADC_P2  : -4.47658e-06 ± 2.64115e-06
  CSA_Chi2/NDF : 1.22480e-04 / 2
  CSA_P0  : 6.16295e-02 ± 7.38168e-03
  CSA_P1  : 9.91683e-03 ± 5.56156e-04
  CSA_P2  : -4.78384e-05 ± 8.46960e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 8, 28, 44, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 16, 31, 96, 103, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3797', '1.800', '0.1617', '1.800', '0.0885', '7.000', '0.7072', 1, 1, 1, 1, 1724934538.0767052]
VI_after__Init : ['1.202', '0.3801', '1.800', '0.1617', '1.800', '0.0827', '7.000', '0.7070', 1, 1, 1, 1, 1724934546.2710466]
VI_at__the_End : ['1.202', '0.4946', '1.800', '0.1404', '1.804', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1724934605.0709422]