TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_30_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-024-06 | FUSED_ID : 6359364768389710214
  IC_TEMP :  -51.74 | VDDM : 1132.19 | AUX_INT :   -8.86 | CsaBias :   66.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30442e-03 / 2
  ADC_P0  : -8.85965e-03 ± 2.44536e-02
  ADC_P1  : 8.46071e-03 ± 5.98257e-04
  ADC_P2  : -6.27496e-06 ± 2.90379e-06
  CSA_Chi2/NDF : 1.02062e-04 / 2
  CSA_P0  : 5.94770e-02 ± 6.73836e-03
  CSA_P1  : 9.94278e-03 ± 5.07687e-04
  CSA_P2  : -4.42457e-05 ± 7.73147e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [23, 32, 57, 72, 116, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [11, 31, 41, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2517', '1.800', '0.1608', '1.800', '0.0852', '7.000', '0.7069', 1, 1, 1, 1, 1724934632.9575372]
VI_after__Init : ['1.202', '0.2518', '1.800', '0.1608', '1.799', '0.0796', '7.000', '0.7069', 1, 1, 1, 1, 1724934641.2247036]
VI_at__the_End : ['1.201', '0.5048', '1.800', '0.1397', '1.802', '0.1107', '7.000', '0.7078', 1, 1, 1, 1, 1724934698.9507961]