TEST_NAME : Wafer
TEST_DATE : 24_08_29-15_13_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-003-12 | FUSED_ID : 6359364768389713980
  IC_TEMP :  -53.82 | VDDM : 1132.82 | AUX_INT :   -6.16 | CsaBias :   76.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.41567e-04 / 2
  ADC_P0  : -6.16043e-03 ± 1.84500e-02
  ADC_P1  : 8.33042e-03 ± 4.64303e-04
  ADC_P2  : -4.91481e-06 ± 2.31312e-06
  CSA_Chi2/NDF : 1.67635e-04 / 2
  CSA_P0  : 5.98218e-02 ± 8.63584e-03
  CSA_P1  : 1.02263e-02 ± 6.50648e-04
  CSA_P2  : -4.86557e-05 ± 9.90861e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 27, 33, 78, 94, 107, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [14, 61, 62, 66, 73, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3016', '1.800', '0.1774', '1.800', '0.0878', '7.000', '0.7075', 1, 1, 1, 1, 1724937218.0554805]
VI_after__Init : ['1.201', '0.3016', '1.800', '0.1773', '1.801', '0.0820', '7.000', '0.7078', 1, 1, 1, 1, 1724937226.2168617]
VI_at__the_End : ['1.202', '0.5072', '1.800', '0.1412', '1.803', '0.1117', '7.000', '0.7083', 1, 1, 1, 1, 1724937285.2074337]