TEST_NAME : Wafer
TEST_DATE : 24_08_29-15_05_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-008-12 | FUSED_ID : 6359364768389714060
  IC_TEMP :  -56.42 | VDDM : 1130.78 | AUX_INT :   -7.67 | CsaBias :   74.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01070e-03 / 2
  ADC_P0  : -7.67281e-03 ± 2.15318e-02
  ADC_P1  : 8.30912e-03 ± 5.29544e-04
  ADC_P2  : -5.39011e-06 ± 2.58481e-06
  CSA_Chi2/NDF : 1.56313e-04 / 2
  CSA_P0  : 5.85971e-02 ± 8.33910e-03
  CSA_P1  : 9.84178e-03 ± 6.28291e-04
  CSA_P2  : -4.85408e-05 ± 9.56813e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [10, 29, 34, 56, 86, 87, 91, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [9, 24, 51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4571', '1.800', '0.1489', '1.800', '0.0972', '7.000', '0.7076', 1, 1, 1, 1, 1724936736.1908383]
VI_after__Init : ['1.201', '0.4569', '1.800', '0.1492', '1.800', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1724936744.37227]
VI_at__the_End : ['1.201', '0.4815', '1.800', '0.1385', '1.803', '0.1150', '7.000', '0.7085', 1, 1, 1, 1, 1724936811.2264779]