TEST_NAME : Wafer
TEST_DATE : 24_08_29-15_00_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-011-12 | FUSED_ID : 6359364768389714108
  IC_TEMP :  -45.66 | VDDM : 1130.83 | AUX_INT :   -5.73 | CsaBias :   66.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.28640e-04 / 2
  ADC_P0  : -5.73050e-03 ± 1.82838e-02
  ADC_P1  : 8.01402e-03 ± 4.42383e-04
  ADC_P2  : -4.66913e-06 ± 2.11452e-06
  CSA_Chi2/NDF : 1.16567e-04 / 2
  CSA_P0  : 5.82056e-02 ± 7.20128e-03
  CSA_P1  : 9.92098e-03 ± 5.42565e-04
  CSA_P2  : -4.61624e-05 ± 8.26262e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [10, 20, 63, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [10, 16, 34, 54, 67, 77, 103, 104, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4771', '1.800', '0.1512', '1.800', '0.0887', '7.000', '0.7075', 1, 1, 1, 1, 1724936447.3268511]
VI_after__Init : ['1.201', '0.4775', '1.800', '0.1512', '1.799', '0.0830', '7.000', '0.7075', 1, 1, 1, 1, 1724936455.3152907]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1366', '1.800', '0.1099', '7.000', '0.7083', 1, 1, 1, 1, 1724936523.45697]