TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_55_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-014-12 | FUSED_ID : 6359364768389714156
  IC_TEMP :  -53.37 | VDDM : 1125.81 | AUX_INT :   -7.26 | CsaBias :   66.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.71510e-04 / 2
  ADC_P0  : -7.26013e-03 ± 1.99577e-02
  ADC_P1  : 8.29282e-03 ± 4.84959e-04
  ADC_P2  : -5.79806e-06 ± 2.33237e-06
  CSA_Chi2/NDF : 1.51002e-04 / 2
  CSA_P0  : 6.05198e-02 ± 8.19622e-03
  CSA_P1  : 1.01699e-02 ± 6.17526e-04
  CSA_P2  : -4.97575e-05 ± 9.40419e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [20, 30, 83, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [38, 62, 84, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2663', '1.800', '0.1672', '1.800', '0.0922', '7.000', '0.7079', 1, 1, 1, 1, 1724936158.937467]
VI_after__Init : ['1.201', '0.2664', '1.800', '0.1672', '1.800', '0.0847', '7.000', '0.7069', 1, 1, 1, 1, 1724936167.0817623]
VI_at__the_End : ['1.201', '0.5015', '1.800', '0.1409', '1.800', '0.1111', '7.000', '0.7079', 1, 1, 1, 1, 1724936227.3270802]