TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_52_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-016-11 | FUSED_ID : 6359364768389714187
  IC_TEMP :  361.08 | VDDM :   -8.16 | AUX_INT :   -8.16 | CsaBias :   -8.16
  CONF_FAIL_REG : 4235
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 0.00000e+00 / 2
  ADC_P0  : -8.16271e-03 ± 2.33909e-02
  ADC_P1  : 8.20213e-03 ± 5.68547e-04
  ADC_P2  : -5.18148e-06 ± 2.74526e-06
  CSA_Chi2/NDF : 1.89657e-07 / 2
  CSA_P0  : 1.56502e-02 ± 2.90474e-04
  CSA_P1  : 6.51355e-07 ± 2.18851e-05
  CSA_P2  : -1.39630e-07 ± 3.33284e-07
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [15, 23, 47, 70, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [59, 116, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0161', '0.366', '0.2494', '1.800', '0.0667', '7.000', '0.7078', 1, 1, 1, 1, 1724935966.446534]
VI_after__Init : ['1.201', '0.0160', '0.366', '0.2500', '1.800', '0.0594', '7.000', '0.7068', 1, 1, 1, 1, 1724935974.6449494]
VI_at__the_End : ['1.201', '0.0157', '0.372', '0.2502', '1.800', '0.0641', '7.000', '0.7077', 1, 1, 1, 1, 1724936032.4373522]