TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_51_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-017-11 | FUSED_ID : 6359364768389714203
  IC_TEMP :  -48.07 | VDDM : 1125.47 | AUX_INT :   -8.16 | CsaBias :   81.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19003e-03 / 2
  ADC_P0  : -8.16271e-03 ± 2.33909e-02
  ADC_P1  : 8.20213e-03 ± 5.68547e-04
  ADC_P2  : -5.18148e-06 ± 2.74526e-06
  CSA_Chi2/NDF : 9.59343e-05 / 2
  CSA_P0  : 5.95750e-02 ± 6.53295e-03
  CSA_P1  : 9.74935e-03 ± 4.92211e-04
  CSA_P2  : -4.26879e-05 ± 7.49579e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 15, 18, 41, 79, 102, 106, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 13, 82, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4232', '1.800', '0.1258', '1.800', '0.0872', '7.000', '0.7069', 1, 1, 1, 1, 1724935870.320168]
VI_after__Init : ['1.201', '0.4233', '1.800', '0.1258', '1.799', '0.0816', '7.000', '0.7067', 1, 1, 1, 1, 1724935878.4345827]
VI_at__the_End : ['1.201', '0.5008', '1.800', '0.1378', '1.800', '0.1085', '7.000', '0.7079', 1, 1, 1, 1, 1724935938.1818063]