TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_46_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-020-11 | FUSED_ID : 6359364768389714251
  IC_TEMP :  -59.93 | VDDM : 1217.67 | AUX_INT : -925.35 | CsaBias : -645.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.64629e-02 / 2
  ADC_P0  : -9.25353e-01 ± 4.13032e-01
  ADC_P1  : 2.21910e-02 ± 7.93140e-03
  ADC_P2  : -5.37351e-05 ± 3.13876e-05
  CSA_Chi2/NDF : 5.07258e-05 / 2
  CSA_P0  : 6.18372e-02 ± 4.75047e-03
  CSA_P1  : 9.04391e-03 ± 3.57914e-04
  CSA_P2  : -3.35454e-05 ± 5.45061e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [15, 31, 45, 46, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 19, 55, 70, 95, 105, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1912', '1.800', '0.1468', '1.799', '0.0824', '7.000', '0.7069', 1, 1, 1, 1, 1724935584.099586]
VI_after__Init : ['1.202', '0.1912', '1.800', '0.1468', '1.800', '0.0770', '7.000', '0.7069', 1, 1, 1, 1, 1724935592.1210217]
VI_at__the_End : ['1.201', '0.4960', '1.800', '0.1384', '1.809', '0.1103', '7.000', '0.7072', 1, 1, 1, 1, 1724935650.9964263]