TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_44_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-021-11 | FUSED_ID : 6359364768389714267
  IC_TEMP :  -47.55 | VDDM : 1133.20 | AUX_INT :   -6.47 | CsaBias :   74.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.86987e-04 / 2
  ADC_P0  : -6.46658e-03 ± 2.12892e-02
  ADC_P1  : 8.10483e-03 ± 5.15121e-04
  ADC_P2  : -5.12351e-06 ± 2.45984e-06
  CSA_Chi2/NDF : 7.94951e-05 / 2
  CSA_P0  : 5.82007e-02 ± 5.94693e-03
  CSA_P1  : 9.79088e-03 ± 4.48058e-04
  CSA_P2  : -4.26260e-05 ± 6.82339e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [14, 31, 46, 54, 65, 66, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [1, 22, 52, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1453', '1.800', '0.1780', '1.799', '0.0865', '7.000', '0.7069', 1, 1, 1, 1, 1724935487.075486]
VI_after__Init : ['1.201', '0.1453', '1.800', '0.1780', '1.800', '0.0809', '7.000', '0.7069', 1, 1, 1, 1, 1724935495.8407278]
VI_at__the_End : ['1.201', '0.5028', '1.800', '0.1379', '1.800', '0.1096', '7.000', '0.7074', 1, 1, 1, 1, 1724935555.4579754]