TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_43_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-013-022-11 | FUSED_ID : 6359364768389714283
  IC_TEMP :  -54.28 | VDDM : 1111.32 | AUX_INT :   -7.64 | CsaBias :   80.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14750e-03 / 2
  ADC_P0  : -7.63922e-03 ± 2.29709e-02
  ADC_P1  : 8.02995e-03 ± 5.48303e-04
  ADC_P2  : -4.96072e-06 ± 2.59313e-06
  CSA_Chi2/NDF : 1.09489e-04 / 2
  CSA_P0  : 5.82747e-02 ± 6.97923e-03
  CSA_P1  : 9.70326e-03 ± 5.25834e-04
  CSA_P2  : -4.33592e-05 ± 8.00783e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 32, 51, 88, 93, 106, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [15, 27, 30, 79, 91, 108, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3037', '1.800', '0.1311', '1.800', '0.0887', '7.000', '0.7068', 1, 1, 1, 1, 1724935391.0090237]
VI_after__Init : ['1.201', '0.3036', '1.800', '0.1310', '1.800', '0.0829', '7.000', '0.7066', 1, 1, 1, 1, 1724935398.983466]
VI_at__the_End : ['1.197', '0.4935', '1.800', '0.1352', '1.804', '0.1107', '7.000', '0.7075', 1, 1, 1, 1, 1724935459.9515514]