TEST_NAME : Wafer
TEST_DATE : 24_08_29-15_32_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-014-014-02 | FUSED_ID : 6359364768389718242
  IC_TEMP :  -50.61 | VDDM : 1132.02 | AUX_INT :   -9.11 | CsaBias :   87.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44367e-03 / 2
  ADC_P0  : -9.11085e-03 ± 2.57729e-02
  ADC_P1  : 8.13687e-03 ± 6.15957e-04
  ADC_P2  : -5.26865e-06 ± 2.92904e-06
  CSA_Chi2/NDF : 1.10306e-04 / 2
  CSA_P0  : 6.03607e-02 ± 7.00523e-03
  CSA_P1  : 1.01117e-02 ± 5.27794e-04
  CSA_P2  : -4.68366e-05 ± 8.03768e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [17, 24, 27, 35, 60, 69]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 37, 54, 62, 99, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1993', '1.800', '0.1637', '1.800', '0.0877', '7.000', '0.7069', 1, 1, 1, 1, 1724938373.017556]
VI_after__Init : ['1.201', '0.1994', '1.800', '0.1637', '1.800', '0.0824', '7.000', '0.7069', 1, 1, 1, 1, 1724938381.2001002]
VI_at__the_End : ['1.201', '0.5078', '1.800', '0.1399', '1.800', '0.1100', '7.000', '0.7074', 1, 1, 1, 1, 1724938448.8518996]