TEST_NAME : Wafer
TEST_DATE : 24_08_29-15_34_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-014-015-02 | FUSED_ID : 6359364768389718258
  IC_TEMP :  -48.83 | VDDM : 1132.39 | AUX_INT :   -7.37 | CsaBias :   79.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.22135e-04 / 2
  ADC_P0  : -7.36655e-03 ± 2.05682e-02
  ADC_P1  : 7.97752e-03 ± 4.88343e-04
  ADC_P2  : -4.83464e-06 ± 2.30136e-06
  CSA_Chi2/NDF : 1.05239e-04 / 2
  CSA_P0  : 5.95828e-02 ± 6.84242e-03
  CSA_P1  : 1.03424e-02 ± 5.15527e-04
  CSA_P2  : -4.96165e-05 ± 7.85087e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [35, 40, 54, 79, 83, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [20, 40, 62, 109, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3879', '1.800', '0.1486', '1.800', '0.0933', '7.000', '0.7076', 1, 1, 1, 1, 1724938468.7644212]
VI_after__Init : ['1.201', '0.3880', '1.800', '0.1485', '1.801', '0.0859', '7.000', '0.7066', 1, 1, 1, 1, 1724938476.896714]
VI_at__the_End : ['1.201', '0.5105', '1.800', '0.1396', '1.799', '0.1097', '7.000', '0.7076', 1, 1, 1, 1, 1724938537.210034]