TEST_NAME : Wafer
TEST_DATE : 24_08_29-15_39_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-014-018-05 | FUSED_ID : 6359364768389718309
  IC_TEMP :  -44.86 | VDDM : 1129.35 | AUX_INT :   -6.15 | CsaBias :   87.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.04954e-04 / 2
  ADC_P0  : -6.14866e-03 ± 1.92448e-02
  ADC_P1  : 7.87823e-03 ± 4.61768e-04
  ADC_P2  : -4.11301e-06 ± 2.19578e-06
  CSA_Chi2/NDF : 7.66351e-05 / 2
  CSA_P0  : 5.94539e-02 ± 5.83897e-03
  CSA_P1  : 9.73137e-03 ± 4.39924e-04
  CSA_P2  : -4.18850e-05 ± 6.69953e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [42, 49, 83, 87, 98, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [23, 29, 32, 52, 75, 91, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3264', '1.800', '0.1710', '1.800', '0.0951', '7.000', '0.7073', 1, 1, 1, 1, 1724938758.0491467]
VI_after__Init : ['1.201', '0.3264', '1.800', '0.1709', '1.800', '0.0876', '7.000', '0.7066', 1, 1, 1, 1, 1724938766.9054394]
VI_at__the_End : ['1.201', '0.5012', '1.800', '0.1375', '1.802', '0.1080', '7.000', '0.7074', 1, 1, 1, 1, 1724938827.0584822]