TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_24_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-015-006-15 | FUSED_ID : 6359364768389722223
  IC_TEMP :  -55.70 | VDDM : 1124.08 | AUX_INT :   -5.73 | CsaBias :   70.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.41650e-04 / 2
  ADC_P0  : -5.73489e-03 ± 1.57068e-02
  ADC_P1  : 8.47742e-03 ± 3.92967e-04
  ADC_P2  : -6.00495e-06 ± 1.94066e-06
  CSA_Chi2/NDF : 1.58861e-04 / 2
  CSA_P0  : 5.86935e-02 ± 8.40682e-03
  CSA_P1  : 9.91102e-03 ± 6.33393e-04
  CSA_P2  : -4.79835e-05 ± 9.64582e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [0, 23, 53, 67, 70, 71, 79, 105, 123, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 17, 20, 48, 106, 107, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2673', '1.800', '0.1664', '1.800', '0.0893', '7.000', '0.7076', 1, 1, 1, 1, 1724941448.5733309]
VI_after__Init : ['1.202', '0.2673', '1.800', '0.1663', '1.800', '0.0821', '7.000', '0.7068', 1, 1, 1, 1, 1724941456.6967456]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1379', '1.801', '0.1113', '7.000', '0.7075', 1, 1, 1, 1, 1724941516.4062862]