TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_22_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-015-007-15 | FUSED_ID : 6359364768389722239
  IC_TEMP :  -65.26 | VDDM : 1217.35 | AUX_INT : -954.98 | CsaBias : -706.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.43664e-02 / 2
  ADC_P0  : -9.54979e-01 ± 3.94194e-01
  ADC_P1  : 2.32442e-02 ± 7.66702e-03
  ADC_P2  : -5.81531e-05 ± 3.08334e-05
  CSA_Chi2/NDF : 1.34445e-04 / 2
  CSA_P0  : 6.02581e-02 ± 7.73384e-03
  CSA_P1  : 9.93925e-03 ± 5.82689e-04
  CSA_P2  : -4.76012e-05 ± 8.87366e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [25, 53, 59, 63, 86, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [38, 46, 48, 71, 96, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3241', '1.800', '0.1582', '1.800', '0.0960', '7.000', '0.7076', 1, 1, 1, 1, 1724941352.8475811]
VI_after__Init : ['1.201', '0.3241', '1.800', '0.1582', '1.800', '0.0884', '7.000', '0.7068', 1, 1, 1, 1, 1724941360.918927]
VI_at__the_End : ['1.201', '0.4934', '1.800', '0.1390', '1.800', '0.1110', '7.000', '0.7077', 1, 1, 1, 1, 1724941428.4319968]