TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_14_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-015-012-15 | FUSED_ID : 6359364768389722319
  IC_TEMP :  -48.06 | VDDM : 1126.35 | AUX_INT :   -7.30 | CsaBias :   85.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85820e-04 / 2
  ADC_P0  : -7.29879e-03 ± 2.13114e-02
  ADC_P1  : 7.81063e-03 ± 5.04511e-04
  ADC_P2  : -4.02308e-06 ± 2.37612e-06
  CSA_Chi2/NDF : 1.07652e-04 / 2
  CSA_P0  : 5.92878e-02 ± 6.92045e-03
  CSA_P1  : 9.76193e-03 ± 5.21406e-04
  CSA_P2  : -4.35967e-05 ± 7.94039e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [37, 41, 73, 75, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [22, 23, 39, 45, 51, 77, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3131', '1.800', '0.1699', '1.800', '0.0949', '7.000', '0.7070', 1, 1, 1, 1, 1724940873.536778]
VI_after__Init : ['1.201', '0.3133', '1.800', '0.1700', '1.800', '0.0891', '7.000', '0.7070', 1, 1, 1, 1, 1724940882.3260198]
VI_at__the_End : ['1.201', '0.4977', '1.800', '0.1372', '1.800', '0.1107', '7.000', '0.7076', 1, 1, 1, 1, 1724940941.3537955]