TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_08_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-015-016-08 | FUSED_ID : 6359364768389722376
  IC_TEMP :  -54.35 | VDDM : 1116.06 | AUX_INT :   -8.09 | CsaBias :   80.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19756e-03 / 2
  ADC_P0  : -8.08794e-03 ± 2.34495e-02
  ADC_P1  : 8.06996e-03 ± 5.56813e-04
  ADC_P2  : -5.27363e-06 ± 2.62158e-06
  CSA_Chi2/NDF : 1.36299e-04 / 2
  CSA_P0  : 5.83537e-02 ± 7.78696e-03
  CSA_P1  : 9.89529e-03 ± 5.86691e-04
  CSA_P2  : -4.79569e-05 ± 8.93462e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [25, 61, 116, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 3, 5, 24, 46, 59, 102, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4021', '1.800', '0.1417', '1.800', '0.0935', '7.000', '0.7074', 1, 1, 1, 1, 1724940489.8377597]
VI_after__Init : ['1.201', '0.4022', '1.800', '0.1413', '1.800', '0.0877', '7.000', '0.7073', 1, 1, 1, 1, 1724940497.9910166]
VI_at__the_End : ['1.201', '0.4904', '1.800', '0.1380', '1.800', '0.1104', '7.000', '0.7080', 1, 1, 1, 1, 1724940564.4358537]