TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_06_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-015-017-08 | FUSED_ID : 6359364768389722392
  IC_TEMP :  -56.05 | VDDM : 1118.29 | AUX_INT :   -7.98 | CsaBias :   59.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10091e-03 / 2
  ADC_P0  : -7.97799e-03 ± 2.24556e-02
  ADC_P1  : 8.52167e-03 ± 5.58944e-04
  ADC_P2  : -6.16032e-06 ± 2.75572e-06
  CSA_Chi2/NDF : 1.31092e-04 / 2
  CSA_P0  : 6.00049e-02 ± 7.63679e-03
  CSA_P1  : 9.66393e-03 ± 5.75377e-04
  CSA_P2  : -4.72911e-05 ± 8.76231e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [18, 34, 39, 46, 61, 93, 99, 104, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [44, 45, 57, 74, 86, 90, 96, 100, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4333', '1.800', '0.1335', '1.800', '0.0926', '7.000', '0.7076', 1, 1, 1, 1, 1724940394.0711691]
VI_after__Init : ['1.201', '0.4329', '1.800', '0.1336', '1.800', '0.0873', '7.000', '0.7074', 1, 1, 1, 1, 1724940402.2125652]
VI_at__the_End : ['1.201', '0.4772', '1.800', '0.1371', '1.800', '0.1128', '7.000', '0.7082', 1, 1, 1, 1, 1724940469.6862435]