TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_00_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-015-021-08 | FUSED_ID : 6359364768389722456
  IC_TEMP :  -54.77 | VDDM : 1117.59 | AUX_INT :   -8.54 | CsaBias :   81.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34779e-03 / 2
  ADC_P0  : -8.53564e-03 ± 2.49373e-02
  ADC_P1  : 8.21077e-03 ± 6.13491e-04
  ADC_P2  : -4.68829e-06 ± 3.00674e-06
  CSA_Chi2/NDF : 1.62831e-04 / 2
  CSA_P0  : 6.02289e-02 ± 8.51120e-03
  CSA_P1  : 1.04436e-02 ± 6.41257e-04
  CSA_P2  : -5.27050e-05 ± 9.76559e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [20, 21, 56, 93, 94, 95, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [33, 68, 71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1628', '1.800', '0.1666', '1.800', '0.0848', '7.000', '0.7077', 1, 1, 1, 1, 1724940009.5133314]
VI_after__Init : ['1.201', '0.1628', '1.800', '0.1660', '1.800', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1724940017.6047084]
VI_at__the_End : ['1.201', '0.5051', '1.800', '0.1393', '1.800', '0.1117', '7.000', '0.7085', 1, 1, 1, 1, 1724940077.3330092]