TEST_NAME : Wafer
TEST_DATE : 24_08_29-15_53_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-015-025-08 | FUSED_ID : 6359364768389722520
  IC_TEMP :  -51.65 | VDDM : 1130.80 | AUX_INT :   -6.72 | CsaBias :   95.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.19143e-04 / 2
  ADC_P0  : -6.72053e-03 ± 2.05435e-02
  ADC_P1  : 7.95275e-03 ± 4.88756e-04
  ADC_P2  : -4.76746e-06 ± 2.30113e-06
  CSA_Chi2/NDF : 9.65534e-05 / 2
  CSA_P0  : 5.80983e-02 ± 6.55400e-03
  CSA_P1  : 9.56533e-03 ± 4.93796e-04
  CSA_P2  : -3.85646e-05 ± 7.51993e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [42, 63, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 28, 74, 78, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1650', '1.800', '0.1328', '1.800', '0.0814', '7.000', '0.7075', 1, 1, 1, 1, 1724939623.9467726]
VI_after__Init : ['1.201', '0.1649', '1.800', '0.1328', '1.800', '0.0755', '7.000', '0.7074', 1, 1, 1, 1, 1724939632.1950562]
VI_at__the_End : ['1.201', '0.5042', '1.800', '0.1344', '1.800', '0.1088', '7.000', '0.7086', 1, 1, 1, 1, 1724939699.499713]