TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_32_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-008-07 | FUSED_ID : 6359364768389726343
  IC_TEMP :  -49.82 | VDDM : 1111.23 | AUX_INT :   -8.74 | CsaBias :   81.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57091e-03 / 2
  ADC_P0  : -8.74167e-03 ± 2.69619e-02
  ADC_P1  : 8.23996e-03 ± 6.69185e-04
  ADC_P2  : -4.54446e-06 ± 3.31064e-06
  CSA_Chi2/NDF : 1.22430e-04 / 2
  CSA_P0  : 5.99574e-02 ± 7.38018e-03
  CSA_P1  : 9.71710e-03 ± 5.56043e-04
  CSA_P2  : -4.23152e-05 ± 8.46788e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [12, 17, 27]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 47, 62, 83, 94, 122, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2862', '1.800', '0.1163', '1.800', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1724941929.4990244]
VI_after__Init : ['1.201', '0.2863', '1.800', '0.1163', '1.800', '0.0778', '7.000', '0.7064', 1, 1, 1, 1, 1724941938.2213113]
VI_at__the_End : ['1.201', '0.5012', '1.800', '0.1379', '1.800', '0.1091', '7.000', '0.7075', 1, 1, 1, 1, 1724941994.7860017]