TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_43_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-015-07 | FUSED_ID : 6359364768389726455
  IC_TEMP :  -51.56 | VDDM : 1130.50 | AUX_INT :   -8.76 | CsaBias :   79.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22938e-03 / 2
  ADC_P0  : -8.76422e-03 ± 2.37487e-02
  ADC_P1  : 8.09659e-03 ± 5.62731e-04
  ADC_P2  : -5.35127e-06 ± 2.65179e-06
  CSA_Chi2/NDF : 1.10639e-04 / 2
  CSA_P0  : 5.83140e-02 ± 7.01579e-03
  CSA_P1  : 9.70451e-03 ± 5.28589e-04
  CSA_P2  : -4.05650e-05 ± 8.04979e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [10, 21, 35, 42, 49, 54, 70, 91, 103, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [72, 80, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3527', '1.800', '0.1657', '1.800', '0.0885', '7.000', '0.7079', 1, 1, 1, 1, 1724942603.0554445]
VI_after__Init : ['1.201', '0.3528', '1.800', '0.1657', '1.800', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1724942611.1738768]
VI_at__the_End : ['1.201', '0.5050', '1.800', '0.1400', '1.800', '0.1097', '7.000', '0.7082', 1, 1, 1, 1, 1724942679.6895862]