TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_44_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-016-00 | FUSED_ID : 6359364768389726464
  IC_TEMP :  -50.84 | VDDM : 1134.79 | AUX_INT :   -6.17 | CsaBias :   72.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.48492e-04 / 2
  ADC_P0  : -6.17111e-03 ± 2.08780e-02
  ADC_P1  : 7.93204e-03 ± 4.97696e-04
  ADC_P2  : -4.75587e-06 ± 2.34089e-06
  CSA_Chi2/NDF : 9.39711e-05 / 2
  CSA_P0  : 5.95400e-02 ± 6.46576e-03
  CSA_P1  : 9.73731e-03 ± 4.87148e-04
  CSA_P2  : -4.12859e-05 ± 7.41869e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [11, 61, 77, 110, 113, 117, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [36, 66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4120', '1.800', '0.1714', '1.800', '0.0924', '7.000', '0.7075', 1, 1, 1, 1, 1724942698.9971354]
VI_after__Init : ['1.201', '0.4122', '1.800', '0.1712', '1.800', '0.0866', '7.000', '0.7073', 1, 1, 1, 1, 1724942707.0177794]
VI_at__the_End : ['1.201', '0.5057', '1.800', '0.1382', '1.800', '0.1090', '7.000', '0.7081', 1, 1, 1, 1, 1724942772.0410562]