TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_46_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-017-00 | FUSED_ID : 6359364768389726480
  IC_TEMP :  -42.67 | VDDM : 1134.65 | AUX_INT :   -8.48 | CsaBias :   92.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43195e-03 / 2
  ADC_P0  : -8.47860e-03 ± 2.57295e-02
  ADC_P1  : 7.78230e-03 ± 6.04168e-04
  ADC_P2  : -3.98582e-06 ± 2.82845e-06
  CSA_Chi2/NDF : 7.42919e-05 / 2
  CSA_P0  : 5.96784e-02 ± 5.74901e-03
  CSA_P1  : 9.49629e-03 ± 4.33146e-04
  CSA_P2  : -3.87266e-05 ± 6.59631e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 17, 57, 69, 70, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 85, 106, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4336', '1.800', '0.1419', '1.800', '0.0894', '7.000', '0.7082', 1, 1, 1, 1, 1724942794.7547054]
VI_after__Init : ['1.201', '0.4336', '1.800', '0.1420', '1.800', '0.0821', '7.000', '0.7073', 1, 1, 1, 1, 1724942802.7721334]
VI_at__the_End : ['1.201', '0.5012', '1.800', '0.1337', '1.800', '0.1076', '7.000', '0.7083', 1, 1, 1, 1, 1724942868.8351285]