TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_48_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-018-00 | FUSED_ID : 6359364768389726496
  IC_TEMP :  -47.39 | VDDM : 1135.79 | AUX_INT :   -7.12 | CsaBias :   86.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00696e-03 / 2
  ADC_P0  : -7.11677e-03 ± 2.15324e-02
  ADC_P1  : 7.81989e-03 ± 5.08096e-04
  ADC_P2  : -4.22956e-06 ± 2.38004e-06
  CSA_Chi2/NDF : 9.76760e-05 / 2
  CSA_P0  : 5.96674e-02 ± 6.59199e-03
  CSA_P1  : 9.64205e-03 ± 4.96659e-04
  CSA_P2  : -4.01990e-05 ± 7.56352e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [19, 20, 34, 79, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 38, 51, 62, 80, 94, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1530', '1.800', '0.1586', '1.800', '0.0822', '7.000', '0.7076', 1, 1, 1, 1, 1724942891.1717954]
VI_after__Init : ['1.202', '0.1530', '1.800', '0.1585', '1.800', '0.0766', '7.000', '0.7073', 1, 1, 1, 1, 1724942899.2553325]
VI_at__the_End : ['1.201', '0.5062', '1.800', '0.1387', '1.800', '0.1076', '7.000', '0.7083', 1, 1, 1, 1, 1724942965.51815]