TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_53_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-021-00 | FUSED_ID : 6359364768389726544
  IC_TEMP :  -50.89 | VDDM : 1131.28 | AUX_INT :   -6.68 | CsaBias :   78.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00497e-03 / 2
  ADC_P0  : -6.67660e-03 ± 2.15264e-02
  ADC_P1  : 7.78753e-03 ± 5.10595e-04
  ADC_P2  : -3.96595e-06 ± 2.40237e-06
  CSA_Chi2/NDF : 1.08843e-04 / 2
  CSA_P0  : 5.69998e-02 ± 6.95862e-03
  CSA_P1  : 9.43748e-03 ± 5.24281e-04
  CSA_P2  : -4.15674e-05 ± 7.98419e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [30, 39, 80, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [15, 25, 54, 56, 59, 65, 95, 102, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2956', '1.800', '0.1747', '1.800', '0.0857', '7.000', '0.7077', 1, 1, 1, 1, 1724943179.7350998]
VI_after__Init : ['1.201', '0.2953', '1.800', '0.1748', '1.800', '0.0804', '7.000', '0.7079', 1, 1, 1, 1, 1724943187.7945366]
VI_at__the_End : ['1.201', '0.4855', '1.800', '0.1333', '1.800', '0.1102', '7.000', '0.7085', 1, 1, 1, 1, 1724943255.3469973]