TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_56_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-016-023-00 | FUSED_ID : 6359364768389726576
  IC_TEMP :  -45.24 | VDDM : 1111.87 | AUX_INT :  -99.01 | CsaBias :   18.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02163e-03 / 2
  ADC_P0  : -9.90135e-02 ± 2.57710e-02
  ADC_P1  : 9.17000e-03 ± 5.76300e-04
  ADC_P2  : -9.28276e-06 ± 2.53582e-06
  CSA_Chi2/NDF : 6.83944e-05 / 2
  CSA_P0  : 5.73137e-02 ± 5.51611e-03
  CSA_P1  : 9.36644e-03 ± 4.15599e-04
  CSA_P2  : -3.57517e-05 ± 6.32908e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 76, 86, 91, 115, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [17, 21, 25, 93, 106, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2054', '1.800', '0.1464', '1.800', '0.0856', '7.000', '0.7079', 1, 1, 1, 1, 1724943372.087783]
VI_after__Init : ['1.201', '0.2051', '1.800', '0.1464', '1.800', '0.0799', '7.000', '0.7077', 1, 1, 1, 1, 1724943380.2893274]
VI_at__the_End : ['1.201', '0.5027', '1.800', '0.1328', '1.800', '0.1074', '7.000', '0.7085', 1, 1, 1, 1, 1724943447.0796273]