TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_21_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-007-10 | FUSED_ID : 6359364768389730426
  IC_TEMP :  -60.62 | VDDM : 1126.84 | AUX_INT :   -7.28 | CsaBias :   78.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.09992e-04 / 2
  ADC_P0  : -7.28245e-03 ± 2.03840e-02
  ADC_P1  : 8.66822e-03 ± 5.11832e-04
  ADC_P2  : -6.79217e-06 ± 2.53707e-06
  CSA_Chi2/NDF : 1.40711e-04 / 2
  CSA_P0  : 5.62598e-02 ± 7.91201e-03
  CSA_P1  : 9.60248e-03 ± 5.96113e-04
  CSA_P2  : -4.36241e-05 ± 9.07809e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [13, 38, 87, 111, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [23, 25, 35, 40, 63, 66, 83, 94, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2479', '1.800', '0.1458', '1.800', '0.0886', '7.000', '0.7067', 1, 1, 1, 1, 1724944914.204415]
VI_after__Init : ['1.202', '0.2478', '1.800', '0.1457', '1.800', '0.0828', '7.000', '0.7066', 1, 1, 1, 1, 1724944922.1856472]
VI_at__the_End : ['1.201', '0.4840', '1.799', '0.1333', '1.800', '0.1116', '7.000', '0.7077', 1, 1, 1, 1, 1724944985.4609058]