TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_20_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-008-10 | FUSED_ID : 6359364768389730442
  IC_TEMP :  -52.13 | VDDM : 1218.53 | AUX_INT : -1050.84 | CsaBias : -741.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.21134e-02 / 2
  ADC_P0  : -1.05084e+00 ± 4.75021e-01
  ADC_P1  : 2.45851e-02 ± 9.13935e-03
  ADC_P2  : -6.25100e-05 ± 3.67103e-05
  CSA_Chi2/NDF : 1.19147e-04 / 2
  CSA_P0  : 5.92543e-02 ± 7.28056e-03
  CSA_P1  : 9.91724e-03 ± 5.48538e-04
  CSA_P2  : -4.33089e-05 ± 8.35358e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [38, 64, 95, 107, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [26, 32, 48, 68, 80, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2928', '1.800', '0.1616', '1.799', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1724944817.6185374]
VI_after__Init : ['1.202', '0.2931', '1.800', '0.1616', '1.800', '0.0782', '7.000', '0.7066', 1, 1, 1, 1, 1724944825.7207713]
VI_at__the_End : ['1.201', '0.5084', '1.800', '0.1377', '1.800', '0.1095', '7.000', '0.7075', 1, 1, 1, 1, 1724944886.5710278]