TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_18_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-009-10 | FUSED_ID : 6359364768389730458
  IC_TEMP :  -55.40 | VDDM : 1128.89 | AUX_INT :   -7.13 | CsaBias :   81.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73042e-04 / 2
  ADC_P0  : -7.12546e-03 ± 2.11290e-02
  ADC_P1  : 8.13439e-03 ± 5.10198e-04
  ADC_P2  : -5.19509e-06 ± 2.43873e-06
  CSA_Chi2/NDF : 1.11929e-04 / 2
  CSA_P0  : 5.89862e-02 ± 7.05657e-03
  CSA_P1  : 9.62270e-03 ± 5.31661e-04
  CSA_P2  : -4.17239e-05 ± 8.09657e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [9, 46, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [25, 26, 56, 66, 68, 72, 73, 106, 107, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1599', '1.800', '0.1475', '1.799', '0.0907', '7.000', '0.7068', 1, 1, 1, 1, 1724944720.1047256]
VI_after__Init : ['1.201', '0.1598', '1.800', '0.1475', '1.800', '0.0849', '7.000', '0.7065', 1, 1, 1, 1, 1724944728.9049628]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1353', '1.800', '0.1113', '7.000', '0.7072', 1, 1, 1, 1, 1724944792.7090259]