TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_15_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-011-10 | FUSED_ID : 6359364768389730490
  IC_TEMP :  -62.67 | VDDM : 1126.81 | AUX_INT :   -7.30 | CsaBias :   68.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15735e-03 / 2
  ADC_P0  : -7.30292e-03 ± 2.31022e-02
  ADC_P1  : 8.44094e-03 ± 5.88665e-04
  ADC_P2  : -4.93806e-06 ± 2.97498e-06
  CSA_Chi2/NDF : 2.04396e-04 / 2
  CSA_P0  : 5.87404e-02 ± 9.53583e-03
  CSA_P1  : 1.00279e-02 ± 7.18456e-04
  CSA_P2  : -5.34547e-05 ± 1.09412e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [2, 5, 91, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [20, 38, 54, 63, 69, 74, 86, 102, 106, 113, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1401', '1.800', '0.1471', '1.800', '0.0816', '7.000', '0.7073', 1, 1, 1, 1, 1724944527.5799885]
VI_after__Init : ['1.202', '0.1401', '1.800', '0.1471', '1.800', '0.0743', '7.000', '0.7065', 1, 1, 1, 1, 1724944535.7053528]
VI_at__the_End : ['1.202', '0.4732', '1.800', '0.1377', '1.800', '0.1153', '7.000', '0.7077', 1, 1, 1, 1, 1724944594.520937]