TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_12_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-013-10 | FUSED_ID : 6359364768389730522
  IC_TEMP :  -52.70 | VDDM : 1113.23 | AUX_INT :   -7.35 | CsaBias :   81.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.50310e-04 / 2
  ADC_P0  : -7.34559e-03 ± 2.08871e-02
  ADC_P1  : 8.12392e-03 ± 5.05999e-04
  ADC_P2  : -4.94528e-06 ± 2.43205e-06
  CSA_Chi2/NDF : 1.30704e-04 / 2
  CSA_P0  : 5.81531e-02 ± 7.62547e-03
  CSA_P1  : 1.02676e-02 ± 5.74524e-04
  CSA_P2  : -4.78893e-05 ± 8.74933e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [34, 84, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 10, 46, 50, 51, 69, 71, 82, 85, 87, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3169', '1.800', '0.1474', '1.800', '0.0866', '7.000', '0.7067', 1, 1, 1, 1, 1724944335.635114]
VI_after__Init : ['1.202', '0.3170', '1.800', '0.1473', '1.800', '0.0812', '7.000', '0.7068', 1, 1, 1, 1, 1724944343.6344862]
VI_at__the_End : ['1.202', '0.5086', '1.800', '0.1373', '1.800', '0.1110', '7.000', '0.7076', 1, 1, 1, 1, 1724944410.272665]