TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_09_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-015-10 | FUSED_ID : 6359364768389730554
  IC_TEMP :  -57.05 | VDDM : 1129.79 | AUX_INT :   -8.40 | CsaBias :   72.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24394e-03 / 2
  ADC_P0  : -8.39550e-03 ± 2.38747e-02
  ADC_P1  : 8.11407e-03 ± 5.62231e-04
  ADC_P2  : -5.76177e-06 ± 2.62109e-06
  CSA_Chi2/NDF : 1.07934e-04 / 2
  CSA_P0  : 5.96551e-02 ± 6.92948e-03
  CSA_P1  : 9.57040e-03 ± 5.22086e-04
  CSA_P2  : -4.32899e-05 ± 7.95076e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 27, 35, 68, 91, 95, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [59, 82, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1890', '1.800', '0.1158', '1.800', '0.0911', '7.000', '0.7077', 1, 1, 1, 1, 1724944143.6251962]
VI_after__Init : ['1.201', '0.1890', '1.800', '0.1158', '1.800', '0.0831', '7.000', '0.7069', 1, 1, 1, 1, 1724944151.7436461]
VI_at__the_End : ['1.201', '0.4871', '1.800', '0.1349', '1.800', '0.1127', '7.000', '0.7076', 1, 1, 1, 1, 1724944220.008684]