TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_07_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-016-13 | FUSED_ID : 6359364768389730573
  IC_TEMP :  -54.56 | VDDM : 1114.69 | AUX_INT :   -8.64 | CsaBias :   79.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26188e-03 / 2
  ADC_P0  : -8.64419e-03 ± 2.40534e-02
  ADC_P1  : 8.11438e-03 ± 5.68181e-04
  ADC_P2  : -5.59404e-06 ± 2.66307e-06
  CSA_Chi2/NDF : 1.45895e-04 / 2
  CSA_P0  : 5.86148e-02 ± 8.05642e-03
  CSA_P1  : 1.00557e-02 ± 6.06993e-04
  CSA_P2  : -4.88716e-05 ± 9.24378e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [16, 44, 57, 60, 76, 102, 105, 118]
 | N_BROKEN_SLOW :  [102]
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 91, 102, 112, 115, 118]
 | P_BROKEN_SLOW :  [102]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3295', '1.800', '0.1607', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1724944047.6642132]
VI_after__Init : ['1.201', '0.3297', '1.800', '0.1607', '1.800', '0.0796', '7.000', '0.7069', 1, 1, 1, 1, 1724944055.7557306]
VI_at__the_End : ['1.200', '0.4947', '1.800', '0.1356', '1.800', '0.1112', '7.000', '0.7076', 1, 1, 1, 1, 1724944122.9467657]