TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_04_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-018-13 | FUSED_ID : 6359364768389730605
  IC_TEMP :  -53.82 | VDDM : 1121.42 | AUX_INT :  -10.43 | CsaBias :   84.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.10637e-03 / 2
  ADC_P0  : -1.04258e-02 ± 3.12187e-02
  ADC_P1  : 7.97684e-03 ± 7.31812e-04
  ADC_P2  : -4.88935e-06 ± 3.42291e-06
  CSA_Chi2/NDF : 1.24364e-04 / 2
  CSA_P0  : 5.85582e-02 ± 7.43823e-03
  CSA_P1  : 1.01460e-02 ± 5.60417e-04
  CSA_P2  : -4.86300e-05 ± 8.53448e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [7, 52, 105, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [48, 69, 73, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3320', '1.800', '0.1498', '1.800', '0.0898', '7.000', '0.7076', 1, 1, 1, 1, 1724943854.1065042]
VI_after__Init : ['1.201', '0.3322', '1.800', '0.1499', '1.800', '0.0842', '7.000', '0.7075', 1, 1, 1, 1, 1724943862.9348216]
VI_at__the_End : ['1.201', '0.5008', '1.800', '0.1368', '1.800', '0.1115', '7.000', '0.7077', 1, 1, 1, 1, 1724943921.7855191]