TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_02_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-019-13 | FUSED_ID : 6359364768389730621
  IC_TEMP :  -46.09 | VDDM : 1132.39 | AUX_INT :   -6.47 | CsaBias :   90.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.20717e-04 / 2
  ADC_P0  : -6.47111e-03 ± 1.81612e-02
  ADC_P1  : 7.51136e-03 ± 4.06420e-04
  ADC_P2  : -4.35985e-06 ± 1.80012e-06
  CSA_Chi2/NDF : 6.46234e-05 / 2
  CSA_P0  : 5.75004e-02 ± 5.36188e-03
  CSA_P1  : 9.21070e-03 ± 4.03979e-04
  CSA_P2  : -3.37487e-05 ± 6.15212e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [9, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [36, 58, 70, 78, 79, 82, 96, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1708', '1.800', '0.1364', '1.800', '0.0862', '7.000', '0.7072', 1, 1, 1, 1, 1724943757.6333508]
VI_after__Init : ['1.201', '0.1708', '1.800', '0.1364', '1.800', '0.0804', '7.000', '0.7072', 1, 1, 1, 1, 1724943765.6247566]
VI_at__the_End : ['1.201', '0.5010', '1.800', '0.1335', '1.800', '0.1070', '7.000', '0.7081', 1, 1, 1, 1, 1724943831.9369993]