TEST_NAME : Wafer
TEST_DATE : 24_08_29-16_57_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-017-022-13 | FUSED_ID : 6359364768389730669
  IC_TEMP :  -50.81 | VDDM : 1132.60 | AUX_INT :   -6.44 | CsaBias :   82.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.50881e-04 / 2
  ADC_P0  : -6.44037e-03 ± 2.08962e-02
  ADC_P1  : 8.09908e-03 ± 5.05611e-04
  ADC_P2  : -5.11264e-06 ± 2.41443e-06
  CSA_Chi2/NDF : 8.81833e-05 / 2
  CSA_P0  : 5.78147e-02 ± 6.26348e-03
  CSA_P1  : 9.70122e-03 ± 4.71908e-04
  CSA_P2  : -3.94237e-05 ± 7.18660e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 21, 38, 56, 70, 89, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3199', '1.800', '0.1294', '1.800', '0.0851', '7.000', '0.7077', 1, 1, 1, 1, 1724943468.6400707]
VI_after__Init : ['1.201', '0.3199', '1.800', '0.1293', '1.800', '0.0793', '7.000', '0.7073', 1, 1, 1, 1, 1724943476.676581]
VI_at__the_End : ['1.201', '0.5092', '1.800', '0.1407', '1.800', '0.1093', '7.000', '0.7083', 1, 1, 1, 1, 1724943545.4226415]