TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_29_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-018-013-04 | FUSED_ID : 6359364768389734612
  IC_TEMP :  -49.44 | VDDM : 1136.08 | AUX_INT :   -7.09 | CsaBias :   66.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.89725e-04 / 2
  ADC_P0  : -7.08673e-03 ± 2.02237e-02
  ADC_P1  : 8.23005e-03 ± 5.01782e-04
  ADC_P2  : -4.66589e-06 ± 2.47478e-06
  CSA_Chi2/NDF : 1.20927e-04 / 2
  CSA_P0  : 6.06964e-02 ± 7.33474e-03
  CSA_P1  : 1.01511e-02 ± 5.52620e-04
  CSA_P2  : -4.66189e-05 ± 8.41574e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [34, 40, 50, 53, 99, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [50, 80, 108, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3950', '1.800', '0.1422', '1.800', '0.0893', '7.000', '0.7069', 1, 1, 1, 1, 1724945394.6542137]
VI_after__Init : ['1.201', '0.3952', '1.800', '0.1422', '1.800', '0.0835', '7.000', '0.7068', 1, 1, 1, 1, 1724945402.6536593]
VI_at__the_End : ['1.201', '0.5114', '1.800', '0.1412', '1.803', '0.1104', '7.000', '0.7076', 1, 1, 1, 1, 1724945462.9506273]