TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_31_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-018-014-04 | FUSED_ID : 6359364768389734628
  IC_TEMP :  -49.47 | VDDM : 1129.81 | AUX_INT :   -8.44 | CsaBias :   94.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34709e-03 / 2
  ADC_P0  : -8.44299e-03 ± 2.48977e-02
  ADC_P1  : 7.95700e-03 ± 5.84535e-04
  ADC_P2  : -5.01990e-06 ± 2.72344e-06
  CSA_Chi2/NDF : 9.45176e-05 / 2
  CSA_P0  : 5.77151e-02 ± 6.48453e-03
  CSA_P1  : 9.83116e-03 ± 4.88563e-04
  CSA_P2  : -4.24903e-05 ± 7.44023e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 9, 65, 79, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [23, 24, 30, 69, 95, 96, 100, 102, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3034', '1.800', '0.1658', '1.800', '0.0872', '7.000', '0.7069', 1, 1, 1, 1, 1724945490.7883303]
VI_after__Init : ['1.201', '0.3035', '1.800', '0.1653', '1.800', '0.0818', '7.000', '0.7067', 1, 1, 1, 1, 1724945498.9706047]
VI_at__the_End : ['1.201', '0.5050', '1.800', '0.1360', '1.800', '0.1087', '7.000', '0.7076', 1, 1, 1, 1, 1724945566.1950402]