TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_34_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-018-016-03 | FUSED_ID : 6359364768389734659
  IC_TEMP :  -48.70 | VDDM : 1126.17 | AUX_INT :   -8.49 | CsaBias :   86.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08538e-03 / 2
  ADC_P0  : -8.49195e-03 ± 2.22688e-02
  ADC_P1  : 7.94440e-03 ± 5.11505e-04
  ADC_P2  : -5.57037e-06 ± 2.33117e-06
  CSA_Chi2/NDF : 7.63145e-05 / 2
  CSA_P0  : 5.77150e-02 ± 5.82674e-03
  CSA_P1  : 9.33769e-03 ± 4.39003e-04
  CSA_P2  : -3.57563e-05 ± 6.68550e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [6, 10, 20, 23, 46, 60, 74, 88, 99, 107, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [5, 12, 15, 49, 50, 53, 74, 104, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2606', '1.800', '0.1172', '1.800', '0.0824', '7.000', '0.7069', 1, 1, 1, 1, 1724945683.2715747]
VI_after__Init : ['1.201', '0.2607', '1.800', '0.1172', '1.800', '0.0767', '7.000', '0.7071', 1, 1, 1, 1, 1724945691.3979392]
VI_at__the_End : ['1.201', '0.5010', '1.800', '0.1349', '1.800', '0.1085', '7.000', '0.7077', 1, 1, 1, 1, 1724945758.5454614]