TEST_NAME : Wafer
TEST_DATE : 24_08_29-17_39_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-018-019-03 | FUSED_ID : 6359364768389734707
  IC_TEMP :  -47.53 | VDDM : 1124.98 | AUX_INT :   -8.70 | CsaBias :   85.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32400e-03 / 2
  ADC_P0  : -8.70053e-03 ± 2.46978e-02
  ADC_P1  : 7.93338e-03 ± 5.83504e-04
  ADC_P2  : -4.53807e-06 ± 2.74815e-06
  CSA_Chi2/NDF : 9.15696e-05 / 2
  CSA_P0  : 5.94290e-02 ± 6.38261e-03
  CSA_P1  : 9.48409e-03 ± 4.80883e-04
  CSA_P2  : -3.67290e-05 ± 7.32328e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 14, 16, 73, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 18, 36, 81, 90, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2057', '1.800', '0.1376', '1.800', '0.0833', '7.000', '0.7072', 1, 1, 1, 1, 1724945972.3084831]
VI_after__Init : ['1.201', '0.2055', '1.800', '0.1375', '1.800', '0.0776', '7.000', '0.7072', 1, 1, 1, 1, 1724945980.3627825]
VI_at__the_End : ['1.201', '0.5078', '1.800', '0.1374', '1.800', '0.1095', '7.000', '0.7082', 1, 1, 1, 1, 1724946040.3909924]